集成电路动态老化测试系统中高速驱动板设计
Design of High-Speed Driving Board for Integrated Circuit of Burn-In Test System

作者: 曾 榕 * , 张福洪 , 楼津甫 :杭州电子科技大学通信工程学院,杭州;

关键词: 集成电路动态老化驱动板现场可编程逻辑门阵列Integrated Circuit Dynamic Burn-In Driving Board FPGA

摘要:
随着大规模集成电路生产技术的迅猛发展,多引脚封装的芯片、大容量的存储器及大规模嵌入式微处理器的广泛应用,国内现有的集成电路动态老化测试系统已不能满足需求。该文针对FPGA/CPLD集成度高、设计灵活等优点,设计并实现了一种应用于新一代动态老化系统的高速驱动板系统。该系统以Altera公司的MAXII系列CPLD芯片EPM570T144I5N为核心。通过FPGA/CPLD软硬件平台验证,该系统各个模块均工作正常,并能满足驱动能力的需求。

Abstract: With the rapid development of production technology for large-scale integrated circuits, applica-tions of multi-pin package chip, large capacity memory and large scale of embedded microprocessor are more and more widely used. Domestic integrated circuit of dynamic burn-in system has been unable to meet the demand. In this paper, taking advantages of FPGA/CPLD high integration, flexible design, etc., it designs and implements high-speed driving board system applied in a new generation of dynamic burn-in system. The system takes the EPM570T144I5N of MAXII series chip in Altera Company as the core. Through the verification of FPGA/CPLD hardware platform, each module of the system works normally and can meet the requirements of driving ability.

文章引用: 曾 榕 , 张福洪 , 楼津甫 (2014) 集成电路动态老化测试系统中高速驱动板设计。 电路与系统, 3, 53-58. doi: 10.12677/OJCS.2014.34009

参考文献

[1] 冉立新 (2003) 大规模集成电路高温动态老化测试嵌入式图形发生系统的可编程ASIC实现. 仪器仪表学报, 24, 27-27.

[2] 温平平, 焦慧芳, 贾新章等 (2004) VLSI老化筛选试验技术的挑战. 电子产品可靠性与环境验, 5, 22-23.

[3] 马进峰, 张福洪, 石学诚 (2013) 集成电路高温动态老化系统硬件研制. 电子制作, 11, 226-226.

[4] 贾伟, 邵左文, 张玉猛等 (2007) 基于SPI总线的高速串行数据采集系统设计. 研发与开发, 4, 37-37.

[5] 石学诚 (2014) 新型存储器老化测试系统的实现. 杭州电子科技大学, 杭州, 32-35.

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