The Parametric Model and Simulation Analysis of IGBT

作者: 耿 涛 , 曹文明 :河南大学物理与电子学院,开封;

关键词: 绝缘栅型晶体管(IGBT)故障检测寿命可靠性IGBT Module Fault Detection Lifetime Reliability


Abstract: In this paper, based on the analysis of the structure and work principle and characteristics of IGBT, the simplified model of IGBT by matlab/simulink is built. The problems of the IGBT failure are analyzed theoretically from the perspectives of IGBT failure factors and failure mechanism, re-spectively. According to simulation results, it was verified that IGBT is subjected to constant electric shocks due to work environment, etc., then, module internal bonding wire begins to creep and fatigue cracks occur, which eventually lead to failure. Thus, the model can be used to predict the lifetime of the IGBT.

文章引用: 耿 涛 , 曹文明 (2014) IGBT参数建模与仿真分析。 计算机科学与应用, 4, 125-134. doi: 10.12677/CSA.2014.47019


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