Surface Defects Inspection of Solar Cell Based on Halcon
Abstract: The high-performance development direction of solar wafer raises higher requirements for its surface defects inspection while the vision software “Halcon10.1” is able to detect those defects reliably and rapidly. In this paper, we use the technology of the vision software “Halcon10.1” which is produced by the company of MVTec in Germany and realize the rapid defects detection including crack, cavern, smudge and broken so on and so forth which can be concluded that the application of this technology helps enhance the inspection efficiency.
文章引用: 黄远民 , 易 铭 , 方 宁 , 李秀忠 , 李 敏 (2013) 基于Halcon的太阳能硅片缺陷检测。 机械工程与技术， 2， 118-122. doi: 10.12677/MET.2013.24023
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