DNA Damage due to PFOA Based on Electrochemiluminescence of CdSe Quantum Dot

作者: 李萌 , 鲁理平 :北京工业大学环境与能源工程学院,北京市朝阳区平乐园100号,100124;

关键词: 电化学发光全氟辛酸DNA损伤硒化镉量子点 ECL sensor PFOA DNA Damage CdSe QDs

>A new electrochemiluminescence (ECL) sensor for detecting dsDNA damage induced by Perfluorooctanoic Acid (PFOA) was presented in this paper. DNA was linked to the Au electrode by the S-Au bound, closed the electrode by MCH and then carboxyl group of the TGA-capped CdSe QDs was covalently conjugated to amino-DNA on the electrode through EDC and NHS. The morphology of the modified electrode (CdSe/dsDNA/Au) was characterized by XPS. Finally, in the presence of K2S2O8 as coreactant, ECL emission of the modified electrode is measured. The results indicate this design was effective for detection the DNA damage.

文章引用: 李萌 , 鲁理平 (2013) CdSe量子点电化学发光检测全氟辛酸(PFOA)对DNA的损伤。 环境保护前沿, 3, 17-19. doi: 10.12677/AEP.2013.31B005


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