材料科学

Vol.2 No.2 (April 2012)

掺锆氧化镍/硅化镍/硅微通道结构的三维超级电容器
Synthesis of Zr Doped NiO Layers on NiSi2/Si-MCP Structures for Supercapacitors

 

作者:

顾林玲 , 刘涛 , 赖佳 , 李劢 , 王斐 , 徐少辉 , 王连卫

 

关键词:

锆掺杂氧化镍电化学性质硅微通道板Zr Doped NiO Electrochemical Properties Silicon Microchannel Plate (MCP)

 

摘要:

本文制作了掺锆氧化镍/硅化镍/硅微通道板结构三维超级电容器。采用电化学刻蚀的方法制成硅微通道板(Si-MCP),并将其作为该三维电容器结构的骨架。采用无电镀的方法在硅微通道上均匀沉积一层掺锆镍金属层,通过将样品在氧气氛围中500℃退火,在硅微通道表面得到掺锆氧化镍层。用场发射扫描电子显微镜(FESEM)和能量色散谱仪(EDX)以及X射线衍射(XRD)表征了此样品的结构和表面形貌,用循环伏安法(CV)和计时电位测试表征了电化学特性,结果表明掺Zr氧化镍/硅化镍/硅微通道结构电容性能有较大提升。

Three-dimensional supercapacitors consisting of Zr doped NiO/NiSi2/silicon microchannel plate (MCP) stacked structures are fabricated. The silicon MCP fabricated by electrochemical etching is utilized as a substrate of 3D structure. After electroless plating of zirconium doped nickel on the surface of the Si-MCP substrate, the Zr doped NiO and NiSi2 are synthesized by annealing at 500˚C in oxygen condition. The structure and morphology of the Zr doped NiO/NiSi2/Si-MCP nanocomposite electrodes are characterized by scanning electron microscopy (SEM), energy-dispersive X-ray spectrometry (EDX) and X-ray diffraction (XRD). The electrochemical properties are determined by cyclic voltammetry (CV) and chronopotentiometry. The results show the improvement of capacity and good reversibility for Zr doped NiO/NiSi2/Si-MCP.

文章引用:

顾林玲 , 刘涛 , 赖佳 , 李劢 , 王斐 , 徐少辉 , 王连卫 (2012) 掺锆氧化镍/硅化镍/硅微通道结构的三维超级电容器。 材料科学, 2, 77-82. doi: 10.12677/ms.2012.22014

 

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